ALTERA C – HA
Entry level/Compact CMM
The ALTERA C HA Series represents a significant leap in the precision capabilities of the already impressive ALTERA C range from LK Metrology. Designed for applications where accuracy is non-negotiable, the HA (High Accuracy) version boasts substantial improvements in volumetric accuracy, repeatability, and tactile scanning performance.
Elevated accuracy for demanding applications
- The ALTERA C HA version offers a 16% higher volumetric accuracy compared to the standard ALTERA C, with figures starting at 1.3+L/350.
- Repeatability has been enhanced by 13%, starting from an exceptional 0.0013 mm.
- Tactile scanning accuracy sees a 50% improvement, beginning at 0.002 mm, setting a new standard for precision in compact CMMs.
Design and engineering excellence
- Focused design improvements have led to a 17% increase in bridge stiffness, thanks to a new main leg design informed by finite element analysis (FEA). This enhancement ensures unparalleled structural integrity and measurement consistency.
- Such advancements underscore LK Metrology’s commitment to leveraging cutting-edge engineering techniques to elevate metrological performance.
Model availability and probing options
- The ALTERA C HA mirrors the model sizes of the standard ALTERA C range, maintaining versatility across a wide spectrum of measurement tasks.
- Users can choose between PH10M or PH10T probe heads, TP200 touch probe, and/or SP25M scanning probe. For those requiring advanced surface detail capture, laser scanning is also an option, broadening the scope of applications.
Application across industries
- With its enhanced accuracy and stiffness, the ALTERA C HA Series is particularly suited for sectors with stringent metrological requirements, including aerospace, automotive, and medical device manufacturing.
- Its robust design and advanced probing capabilities make it an ideal choice for precision engineering tasks, from complex component analysis to intricate design verification.
